Digital and analogue instrumentation [Book :]testing and measurement / Nihal Kularatna.
Von: Kularatna, N.
Mitwirkende(r): Institution of Electrical Engineers.
Materialtyp:
BuchReihen: IEE electrical measurement series ; v. 11. IEE electrical measurement series ; v. 11.Verlag: London : Institution of Electrical Engineers, 2003Auflage: 1st.ed.Beschreibung: xxix, 645 p. : ill. ; 25 cm.ISBN: 0852969996.Weitere Titel: Digital & analogue instrumentation.Schlagwörter: Electronic instruments -- TestingDDC-Klassifikation: 621.381548 | 621.381548
Inhalte:
Introduction -- Enabling technologies -- Data converters -- Waveform parameters, multimeters and pulse techniques -- Fundamentals of oscilloscopes -- Recent developments on DSO techniques -- Electronic counters -- Conventional signal sources and arbitrary waveform generators -- Spectrum analysis -- Logic analysers -- An introduction to instrument buses and VLSI testing -- Transmission measurements -- Digital signal processors -- Sensors -- Calibration of instruments.
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6october 1203 | 621.381548 K D (Regal durchstöbern) | 1 | Verfügbar |
Regale von 6october durchstöbern , Standort: 1203 Regal ausblenden
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| 621.38154 SC A course in electrical and electronic measurements and instrumentation | 621.38154 SC A course in electrical and electronic measurements and instrumentation | 621.381548 B E Electrical and electronic measurement and testing | 621.381548 K D Digital and analogue instrumentation | 621.381548 K E Electronic measurement and instrumentation | 621.381548 K S Electronic measurement and instrumentation | 621.381548 NI Introduction to instrumentation and measurements |
Includes bibliographical references and index.
Introduction -- Enabling technologies -- Data converters -- Waveform parameters, multimeters and pulse techniques -- Fundamentals of oscilloscopes -- Recent developments on DSO techniques -- Electronic counters -- Conventional signal sources and arbitrary waveform generators -- Spectrum analysis -- Logic analysers -- An introduction to instrument buses and VLSI testing -- Transmission measurements -- Digital signal processors -- Sensors -- Calibration of instruments.
All age.
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