Digital systems testing and testable design [Book /] Miron Abramovici, Melvin Breuer, Arthur D. Friedman.
Von: Abramovici, Miron.
Mitwirkende(r): Breuer, Melvin A | Friedman, Arthur D.
Materialtyp: BuchReihen: Electrical engineering communications and signal processing. Verlag: Mumbai : Jaico Puplishing House, 2006Beschreibung: xviii , 652 p : ill ; 26cm.ISBN: 8172248911.Schlagwörter: Digital integrated circuits--Testing | Digital integrated circuits--Design and constructionDDC-Klassifikation: 621.3815Medientyp | Aktueller Standort | Signatur | Exemplarnr. | Status | Fälligkeitsdatum |
---|---|---|---|---|---|
Books | 6october 1203 | 621.3815 AD (Regal durchstöbern) | 1 | Verfügbar |
Regale von 6october durchstöbern , Standort: 1203 Regal ausblenden
621.3815.3 KD Digital electronics | 621.3815.3 KD Digital electronics | 621.3815.3 KD Digital electronics | 621.3815 AD Digital systems testing and testable design | 621.3815 AF Foundations of analog and digital electronic circuits | 621.3815 AF Foundations of analog and digital electronic circuits | 621.3815 B C CMOS circuit design, layout, and simulation |
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