Tolansky, S.  1907- <br/><br/>
Multiple-beam interferometry of surfaces and films,  [[Book] /] 
S. Tolansky. 
 - New York, :  Dover Publications,  [1970]. 
 - vi, 186 p. :  illus. ;  22 cm. 
<br/><br/>Bibliography: p. 184. 
<br/><br/> All Ages. 
<br/><br/><label>ISBN: </label>0486622150 
<br/><br/><label>LCCN: </label>72125910  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Interferometry.<br/>Surfaces (Technology).<br/>Metallography.
<br/><br/><label>LC Class. No.: </label>QC411  / .T6 1970 
<br/><br/><label>Dewey Class. No.: </label>535.4 
<br/><br/><label>National Library of Medicine Call No.: </label> / TM