000 01377cam a2200373 a 4500
005 20150623165220.0
008 990115s2000 nyua b 001 0 eng
010 _a 99013594
020 _a0471364967
035 _9(DLC) 99013594
040 _aDLC
_cDLC
_dDLC
043 _an-us---
050 0 0 _aLB3051
_b.K8 2000
060 _bK E
082 0 0 _a371.260973
_221
084 _a371.260973
_bK E
100 1 _aKubiszyn, Tom.
245 1 0 _aEducational testing and measurement
_h[Book :]
_bclassroom application and practice /
_cTom Kubiszyn, Gary Borich.
250 _a6th ed.
260 _aNew York :
_bWiley,
_cc2000.
300 _axiv, 530 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references (p. 509-520) and index.
521 _aAll age.
650 0 _aEducational tests and measurements
_xUnited States.
700 1 _aBorich, Gary D.
856 4 _3Table of Contents only
_uhttp://www.loc.gov/catdir/toc/onix03/99013594.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0607/99013594-d.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
925 0 _aacquire
_b1 shelf copy
_xpolicy default
955 _apc03 to sa00 01-15-99; sj07 01-15-99; bk rec'd, to CIP ver. ps08 09-28-99; CIP ver. sj03 10-18-99; sj04 10-29-99; to BCCD 10-29-99
001 0000019456
003 0000
942 _cBK
999 _c13584
_d13584