000 01387pam a2200361 a 4500
005 20150706003926.0
008 910311s1992 nyua b 001 0 eng
010 _a 91003045
020 _a002329180X
035 _9(DLC) 91003045
040 _aDLC
_cDLC
_dDLC
050 0 0 _aTS156
_b.D53 1992
060 _bDS
082 0 0 _a658.562015195
_220
084 _a658.562015195
_bDS
100 1 _aDeVor, Richard E.
245 1 0 _aStatistical quality design and control
_h[[Book] :]
_bcontemporary concepts and methods /
_cRichard E. DeVor, Tsong-how Chang, John W. Sutherland.
250 _a1st.ed.
260 _aNew York :
_bMacmillan ;
_aToronto :
_bMaxwell Macmillan Canada ;
_aNew York :
_bMaxwell Macmillan International,
_c1992.
300 _axvi, 809 p. :
_bill. (some col.) ;
_c25 cm.
504 _aIncludes bibliographical references (p. 780-786) and index.
650 0 _aQuality control
_xStatistical methods.
650 0 _aProcess control
_xStatistical methods.
700 1 _aChang, Tsong-how
700 1 _aSutherland, John W.
_q(John William),
_d1958-
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
955 _apc03 to bd00 03-11-91; bd01 to SCD 03-12-91; fg11 03-12-91; fn02 03-14-91; cip ver bc35/04 01-16-92; to SL 01-31-92
991 _bc-GenColl
_hTS156
_i.D53 1992
_tCopy 1
_wBOOKS
001 0000061491
003 0000
942 _cBK
942 _cBK
999 _c49813
_d49813