000 01407cam a22003374a 4500
005 20150706003936.0
008 050316s2005 flua b 001 0 eng
010 _a 2005043711
020 _a0824723155
040 _aDLC
_cDLC
_dDLC
042 _apcc
060 _bB P
082 0 0 _a620.00452015118
_222
084 _a620.00452015118
_bB P
100 1 _aBenaroya, Haym,
_d1954-
245 1 0 _aProbability models in engineering and science
_h[[Book] /]
_cHaym Benaroya and Seon Mi Han.
260 _aBoca Raton :
_bTaylor & Francis,
_c2005.
300 _axvi, 732 p. :
_bill. ;
_c23 cm.
490 1 _aMechanical engineering ;
_vv. 192
504 _aIncludes bibliographical references and index.
650 0 _aReliability (Engineering)
_xMathematical models.
700 1 _aHan, Seon Mi.
830 0 _aMechanical engineering series (Boca Raton, Fla.) ;
_vv. 192.
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0648/2005043711-d.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f20
_gy-gencatlg
925 0 _aacquire
_b2 shelf copies
_xpolicy default
955 _apc12 2005-03-16 to ASCD
_cjf05 2005-03-17 to subj
_djf02 2005-03-18 to sl
_ejf28 2005-03-18 to Dewey
_aaa07 2005-03-24
_aps10 2005-07-22 1 copy rec'd., to CIP ver.
_ajf00 2005-07-27;
_fjf03 2005-07-28;
_gjf03 2005-07-28 to BCCD
_aja21 2006-02-23 Copy 2 to BCCD
001 0000076661
003 0000
942 _cBK
999 _c50621
_d50621