| 000 | 00976cam a2200337 4500 | ||
|---|---|---|---|
| 005 | 20150712005523.0 | ||
| 008 | 700924s1970 nyua b 001 0 eng | ||
| 010 | _a 72125910 | ||
| 020 | _a0486622150 | ||
| 035 | _9(DLC) 72125910 | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 050 | 0 | 0 |
_aQC411 _b.T6 1970 |
| 060 | _bTM | ||
| 082 | 0 | 0 | _a535.4 |
| 084 |
_a535.4 _bTM |
||
| 100 | 1 |
_aTolansky, S. _q(Samuel), _d1907- |
|
| 245 | 1 | 0 |
_aMultiple-beam interferometry of surfaces and films, _h[[Book] /] _c S. Tolansky. |
| 260 |
_aNew York, : _bDover Publications, _c[1970]. |
||
| 300 |
_avi, 186 p. : _billus. ; _c22 cm. |
||
| 350 | _a3.00 | ||
| 504 | _aBibliography: p. 184. | ||
| 521 | _aAll Ages. | ||
| 650 | 0 | _aInterferometry. | |
| 650 | 0 | _aSurfaces (Technology). | |
| 650 | 0 | _aMetallography. | |
| 906 |
_a7 _bcbc _corignew _d2 _encip _f19 _gy-gencatlg |
||
| 991 |
_bc-GenColl _hQC411 _i.T6 1970 _p00036869884 _tCopy 1 _wBOOKS |
||
| 001 | 0000039163 | ||
| 003 | 0000 | ||
| 942 | _cBK | ||
| 999 |
_c54349 _d54349 |
||